Showing 5,621 - 5,630 results of 6,304 for search '"Measurement."', Forespørselstid: 0.04s Refine Results
  1. 5621

    AC loss measurements with a cryocooled sample. af Schwenterly, S.W

    Article

    AC loss measurements with a cryocooled sample.
  2. 5622

    Room-temperature testing for high critical-current-density Josephson junctions. af O'Hara, M.J

    Article

    Room-temperature testing for high critical-current-density Josephson junctions.
  3. 5623

    Optimal transmission ranges and code rates for frequency-hop packet radio networks. af Subbarao, M.W

    Article

    Optimal transmission ranges and code rates for frequency-hop packet radio networks.
  4. 5624

    Power supply transient signal analysis for defect-oriented test. af Plusquellic, J.

    Article

    Power supply transient signal analysis for defect-oriented test.
  5. 5625

    Burst-by-burst adaptive turbo-coded radial basis function-assisted decision feedback equalization. af Yee, M.S

    Article

    Burst-by-burst adaptive turbo-coded radial basis function-assisted decision feedback equalization.
  6. 5626

    On networking sites, learning how not to share.

    Udgivet i Manila bulletin
    Article

    On networking sites, learning how not to share.
  7. 5627

    Online security. af Villaraza, Alexei F.

    Udgivet i Manila bulletin
    Article

    Online security.
  8. 5628

    Study of trapping phenomenon in 4H-SiC MESFETs dependence on substrate purity. af Sghaier, N.

    Article

    Study of trapping phenomenon in 4H-SiC MESFETs dependence on substrate purity.
  9. 5629

    Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs. af Meneghesso, G.

    Article

    Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs.
  10. 5630

    Improvement of surface carrier mobility of HfO2 MOSFETs by high-temperature forming gas annealing. af Onishi, K.

    Article

    Improvement of surface carrier mobility of HfO2 MOSFETs by high-temperature forming gas annealing.

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