Suchergebnisse - "Large-scale integrated circuits."

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  1. 1

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. von Pomeranz, I.

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    Buchumschlag
  2. 2

    The effect of LUT and cluster size on deep-submicron FPGA performance and density. von Ahmed, E.

    Artikel


    Buchumschlag
  3. 3

    A multiple-valued logic and memory with combined single-electron and metal-oxide-semiconductor transistors. von Inokawa, H.

    Artikel


    Buchumschlag
  4. 4

    A multiple-valued logic and memory with combined single-electron and metal-oxide-semiconductor transistors. von Inokawa, H.

    Artikel


    Buchumschlag
  5. 5

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. von Maheshwari, A.

    Artikel


    Buchumschlag
  6. 6

    Design of wireless on-wafer submicron characterization system. von Moore, B.

    Artikel


    Buchumschlag

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