Εμφανίζονται 151 - 160 Αποτελέσματα από 176 για την αναζήτηση '"Ionization"', χρόνος αναζήτησης: 0,01δλ Περιορισμός αποτελεσμάτων
  1. 151

    Conference calendar.

    Άρθρο

    Conference calendar.
  2. 152

    Scattering from an ionized column in the Earth-ionosphere space. ανά Wait, J.R

    Άρθρο

    Scattering from an ionized column in the Earth-ionosphere space.
  3. 153

    Elimination of kink phenomena and drain current hysteresis in InP-based HEMTs with a direct ohmic structure. ανά Sawada, K.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Elimination of kink phenomena and drain current hysteresis in InP-based HEMTs with a direct ohmic structure.
  4. 154

    The effects of nonlocal impact ionization on the speed of avalanche photodiodes. ανά Hambleton, P.J

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    The effects of nonlocal impact ionization on the speed of avalanche photodiodes.
  5. 155

    Impact ionization measurements and modeling for power PHEMT. ανά Baksht, T.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Impact ionization measurements and modeling for power PHEMT.
  6. 156

    On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche. ανά Domeij, M.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche.
  7. 157

    Charge sharing modeling in pixel detectors with capacitive charge division. ανά Marczewski, J.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Charge sharing modeling in pixel detectors with capacitive charge division.
  8. 158

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. ανά Loukianova, N.V

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.
  9. 159

    Total dose and displacement damage effects in a radiation-hardened CMOS APS. ανά Bogaerts, J.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Total dose and displacement damage effects in a radiation-hardened CMOS APS.
  10. 160

    Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs. ανά Hynecek, J.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs.

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