Search Results - "Interconnects (Integrated circuit technology) Reliability."

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    Reliability of RoHS-Compliant 2D and 3D IC interconnects by Lau, John H.

    Published 2011
    Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
    Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
    Electronic Resource


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