Debug automation from pre-silicon to post-silicon por Dehbashi, Mehdi, Fey, Gorschwin

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Genetic algorithms for VLSI design, layout and test automation por Mazumder, Pinaki

VLSI testing digital and mixed analogue/digital techniques por Hurst, Stanley L.

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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VLSI testing digital and mixed analogue/digital techniques por Hurst, Stanley L.

Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access

Algorithmic and knowledge based CAD for VLSI

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Diagnostic measurements in LSI/VLSI integrated circuits production por Jakubowski, Andrzej

Introduction to VLSI testing por Feugate, Robert J. 1946-

Tutorial test generation for VLSI chips