Showing 1 - 2 results of 2 for search '"Integrated circuits Very large scale integration Reliability."', query time: 0.02s Refine Results
  1. 1

    Soft error reliability of VLSI circuits analysis and mitigation techniques by Ghavami, Behnam, Raji, Mohsen

    Published 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Soft error reliability of VLSI circuits analysis and mitigation techniques
  2. 2

    Manufacturing yield evaluation of VLSI/WSI systems

    Published 1995
    Book

    Manufacturing yield evaluation of VLSI/WSI systems

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