Prikaz rezultata 1 – 2 od 2 za pretragu '"Integrated circuits Very large scale integration Reliability."', vrijeme upita: 0,02s Detaljiziraj rezultate
  1. 1

    Soft error reliability of VLSI circuits analysis and mitigation techniques od Ghavami, Behnam, Raji, Mohsen

    Izdano 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Soft error reliability of VLSI circuits analysis and mitigation techniques
  2. 2

    Manufacturing yield evaluation of VLSI/WSI systems

    Izdano 1995
    Knjiga

    Manufacturing yield evaluation of VLSI/WSI systems

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