Mostrando 1 - 2 resultados de 2 para a busca '"Integrated circuits Very large scale integration Reliability."', tempo de busca: 0.03s Refinar Resultados
  1. 1

    Soft error reliability of VLSI circuits analysis and mitigation techniques por Ghavami, Behnam, Raji, Mohsen

    Publicado em 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Soft error reliability of VLSI circuits analysis and mitigation techniques
  2. 2

    Manufacturing yield evaluation of VLSI/WSI systems

    Publicado em 1995
    Livro

    Manufacturing yield evaluation of VLSI/WSI systems

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