Näytetään 1 - 2 yhteensä 2 tuloksesta haulle '"Integrated circuits Very large scale integration Reliability."', hakuaika: 0,02s Tarkenna hakua
  1. 1

    Soft error reliability of VLSI circuits analysis and mitigation techniques Tekijä Ghavami, Behnam, Raji, Mohsen

    Julkaistu 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Soft error reliability of VLSI circuits analysis and mitigation techniques
  2. 2

    Manufacturing yield evaluation of VLSI/WSI systems

    Julkaistu 1995
    Kirja

    Manufacturing yield evaluation of VLSI/WSI systems

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