Mostra 1 - 2 risultati di 2 ricerca '"Integrated circuits Very large scale integration Reliability."', tempo di risposta: 0,02s Raffina i risultati
  1. 1

    Soft error reliability of VLSI circuits analysis and mitigation techniques di Ghavami, Behnam, Raji, Mohsen

    Pubblicazione 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Soft error reliability of VLSI circuits analysis and mitigation techniques
  2. 2

    Manufacturing yield evaluation of VLSI/WSI systems

    Pubblicazione 1995
    Libro

    Manufacturing yield evaluation of VLSI/WSI systems

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