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Design for testability, debug and reliability next generation measures using formal techniques
Vydáno 2021Získat plný text
Získat plný text
Electronic Resource -
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Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
Vydáno 2008Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Vydáno 2000Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
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