Bilaketaren emaitzak - "Integrated circuits Testing."
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21
Design of a 3-D fully depleted SOI computational RAM.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
22
Nine-coded compression technique for testing embedded cores in SoCs.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
23
Design of wireless on-wafer submicron characterization system.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua