Resultados de procura - "Integrated circuits Testing."
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Design for testability, debug and reliability next generation measures using formal techniques
Publicado 2021Ligazón do recurso
Ligazón do recurso
Electronic Resource -
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Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Publicado 1995Libro -
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Publicado 2000Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
Electronic Resource -
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Synchronization overhead in SOC compressed test.
Publicado en IEEE Transactions on VLSI systemsArtigo -
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