Resultados de procura - "Integrated circuits Testing."

Accelerating test, validation and debug of high speed serial interfaces por Fan, Yongquan 1970-

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Design for testability, debug and reliability next generation measures using formal techniques por Huhn, Sebastian, Drechsler, Rolf

Ligazón do recurso
Ligazón do recurso

Analog signal generation for built-in-self-test of mixed-signal integrated circuits por Roberts, Gordon W., 1959-

Digital system test and testable design using HDL models and architectures por Navabi, Zainalabedin

Available for University of the Philippines Diliman via SpringerLink. Click here to access

RF measurements for cellular phones and wireless data systems por Scott, Allan W.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Testing big chips becomes an internal affair. por Runyon, S.

Synchronization overhead in SOC compressed test. por Gonciari, P.T

POMR a power-aware interconnect optimization methodology. por Youssef, A.