Search Results - "Integrated circuits Testing."

Accelerating test, validation and debug of high speed serial interfaces by Fan, Yongquan 1970-

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Design for testability, debug and reliability next generation measures using formal techniques by Huhn, Sebastian, Drechsler, Rolf

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Analog signal generation for built-in-self-test of mixed-signal integrated circuits by Roberts, Gordon W., 1959-

Digital system test and testable design using HDL models and architectures by Navabi, Zainalabedin

Available for University of the Philippines Diliman via SpringerLink. Click here to access

RF measurements for cellular phones and wireless data systems by Scott, Allan W.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

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Testing big chips becomes an internal affair. by Runyon, S.

Synchronization overhead in SOC compressed test. by Gonciari, P.T

POMR a power-aware interconnect optimization methodology. by Youssef, A.