Design for testability, debug and reliability next generation measures using formal techniques por Huhn, Sebastian, Drechsler, Rolf

Obter o texto integral
Obter o texto integral

Circuit design for reliability

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Integrated circuit quality and reliability por Hnatek, Eugene R.

Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. por Schmid, A.

Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques por Tarun, Alvarado B.