检索结果 - "Integrated circuit testing."

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  1. 21

    Design of a 3-D fully depleted SOI computational RAM. 由 Koob, J.C

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  2. 22

    Nine-coded compression technique for testing embedded cores in SoCs. 由 Tehranipoor, M.

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  3. 23

    Design of wireless on-wafer submicron characterization system. 由 Moore, B.

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