Principles of semiconductor network testing by Afshar, Amir

Analog signal generation for built-in-self-test of mixed-signal integrated circuits by Roberts, Gordon W., 1959-

Digital integrated circuit testing from a quality perspective by Hnatek, Eugene R.

Digital circuit testing a guide to DFT and other techniques by Wang, Francis C.

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Design to test a definitive guide for electronic design, manufacture, and service by Turino, Jon L.

Automatic testing and evaluation of digital integrated circuits by Healy, James Thomas 1940-

Testing big chips becomes an internal affair. by Runyon, S.

Synchronization overhead in SOC compressed test. by Gonciari, P.T

Built-in self-test implementation on ARM7TDM-S microprocessor by Esguerra, Ralph Joseph A.

Nine-coded compression technique for testing embedded cores in SoCs. by Tehranipoor, M.