Результаты поиска - "Integrated circuit reliability."

Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques по Tarun, Alvarado B.

Integrated circuit quality and reliability по Hnatek, Eugene R.

Circuit design for reliability

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Design for testability, debug and reliability next generation measures using formal techniques по Huhn, Sebastian, Drechsler, Rolf

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Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. по Schmid, A.