Showing 3,181 - 3,190 results of 3,819 for search '"Integrals."', query time: 0.03s Refine Results
  1. 3181

    Putting passives in their place [PCB integration]. by Ulrich, R.

    Published in IEEE spectrum
    Article

    Putting passives in their place [PCB integration].
  2. 3182

    A touch too much [intrabody communications]. by Goldstein, H.

    Published in IEEE spectrum
    Article

    A touch too much [intrabody communications].
  3. 3183

    Brazil holds all-electronic national election. by Riebeek, H.

    Published in IEEE spectrum
    Article

    Brazil holds all-electronic national election.
  4. 3184

    Integration of Internet and telecommunications an architecture for hybrid services. by Gbaguidi, C.

    Article

    Integration of Internet and telecommunications an architecture for hybrid services.
  5. 3185

    Routing subject to quality of service constraints in integrated communication networks. by Lee, W.C

    Article

    Routing subject to quality of service constraints in integrated communication networks.
  6. 3186

    Power and energy [Technology 2000 analysis and forecast]. by Sweet, W.

    Published in IEEE spectrum
    Article

    Power and energy [Technology 2000 analysis and forecast].
  7. 3187

    Power and energy [Technology 2000 analysis and forecast]. by Sweet, W.

    Published in IEEE spectrum
    Article

    Power and energy [Technology 2000 analysis and forecast].
  8. 3188

    The defensive design of printed-circuit boards. by Berrie, J.

    Published in IEEE spectrum
    Article

    The defensive design of printed-circuit boards.
  9. 3189

    A reciprocity approach for calculating the far-field radiation patterns of a center-fed helical microstrip antenna mounted on a dielectric-coated circular cylinder. by Martin, R.A

    Article

    A reciprocity approach for calculating the far-field radiation patterns of a center-fed helical microstrip antenna mounted on a dielectric-coated circular cylinder.
  10. 3190

    Testing big chips becomes an internal affair. by Runyon, S.

    Published in IEEE spectrum
    Article

    Testing big chips becomes an internal affair.

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