Dangos 1,571 - 1,580 canlyniadau o 2,171 ar gyfer chwilio '"Images."', amser ymholiad: 0.02e Mireinio'r Canlyniadau
  1. 1571

    UV-responsive CCD image sensors with enhanced inorganic phosphor coatings. gan Franks, W.A.R

    Erthygl

    UV-responsive CCD image sensors with enhanced inorganic phosphor coatings.
  2. 1572

    Crosstalk and microlens study in a color CMOS image sensor. gan Agranov, G.

    Erthygl

    Crosstalk and microlens study in a color CMOS image sensor.
  3. 1573

    3-D optical and electrical simulation for CMOS image sensors. gan Mutoh, H.

    Erthygl

    3-D optical and electrical simulation for CMOS image sensors.
  4. 1574

    A CMOS image sensor with a double-junction active pixel. gan Findlater, K.M

    Erthygl

    A CMOS image sensor with a double-junction active pixel.
  5. 1575

    Low-leakage-current and low-operating-voltage buried photodiode for a CMOS imager. gan Inoue, I.

    Erthygl

    Low-leakage-current and low-operating-voltage buried photodiode for a CMOS imager.
  6. 1576

    An enhanced-performance CMOS imager with a flushed-reset photodiode pixel. gan Pain, B.

    Erthygl

    An enhanced-performance CMOS imager with a flushed-reset photodiode pixel.
  7. 1577

    CMOS image sensor with NMOS-only global shutter and enhanced responsivity. gan Wany, M.

    Erthygl

    CMOS image sensor with NMOS-only global shutter and enhanced responsivity.
  8. 1578

    New signal readout method for ultrahigh-sensitivity CMOS image sensor. gan Watabe, T.

    Erthygl

    New signal readout method for ultrahigh-sensitivity CMOS image sensor.
  9. 1579

    Dark current reduction in stacked-type CMOS-APS for charged particle imaging. gan Takayanagi, I.

    Erthygl

    Dark current reduction in stacked-type CMOS-APS for charged particle imaging.
  10. 1580

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. gan Loukianova, N.V

    Erthygl

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.

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