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21
CMOS image sensor with NMOS-only global shutter and enhanced responsivity.
by
Wany, M.
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IEEE Transactions on electron devices
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Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.
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Loukianova, N.V
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IEEE Transactions on electron devices
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23
Transversal-readout architecture for CMOS active pixel image sensors.
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Miyatake, S.
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IEEE Transactions on electron devices
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CAMPUS
Diliman
23 results
23
DATABASE
Union Catalog (Buklod)
23 results
23
UNIT LIBRARY
College of Engineering Library II
23 results
23
RESOURCE TYPE
Article
22 results
22
Book
1 results
1
YEAR OF PUBLICATION
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CLASSIFICATION
T - Technology
1 results
1
SUBJECT
Digital cameras
1 results
1
Image sensors
1 results
1
Optical detectors
1 results
1
AUTHOR
Agranov, G.
1 results
1
Akahane, N.
1 results
1
Akita, J.
1 results
1
Bosiers, J.T
1 results
1
Decoster, Didier 1948-
1 results
1
Etoh, T.G
1 results
1
Felongco, Jose Gamaliel
1 results
1
Findlater, K.M
1 results
1
Franks, W.A.R
1 results
1
Harari, Joseph 1961-
1 results
1
Hsiu-Yu Cheng
1 results
1
Hua-Mei Chen
1 results
1
Krymski, A.I
1 results
1
Kwang-Bo Cho
1 results
1
Loukianova, N.V
1 results
1
Miyatake, S.
1 results
1
Mutoh, H.
1 results
1
Ohta, J.
1 results
1
Oike, Y.
1 results
1
Sargent, E.H
1 results
1
Wany, M.
1 results
1
Watabe, T.
1 results
1
Weston, J.
1 results
1
Yasuda, T.
1 results
1
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LANGUAGE
English
23 results
23
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