Mostrando 21 - 30 Resultados de 48 Para Buscar '"IEEE Transactions on robotics and automation"', tiempo de consulta: 0.02s Limitar resultados
  1. 21

    Guest editorial. por MuDer Jeng

    Artículo

    Guest editorial.
  2. 22

    Queueing network models in the design and analysis of semiconductor wafer fabs. por Kumar, S.

    Artículo

    Queueing network models in the design and analysis of semiconductor wafer fabs.
  3. 23

    Timed Petri nets in modeling and analysis of cluster tools. por Zuberek, W.M

    Artículo

    Timed Petri nets in modeling and analysis of cluster tools.
  4. 24

    Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. por MuDer Jeng

    Artículo

    Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons.
  5. 25

    Production scheduling in a semiconductor wafer fabrication facility producing multiple product types with distinct due dates. por Yeong-Dae Kim

    Artículo

    Production scheduling in a semiconductor wafer fabrication facility producing multiple product types with distinct due dates.
  6. 26

    Scheduling semiconductor wafer fabrication by using ordinal optimization-based simulation. por Bo-Wei Hsieh

    Artículo

    Scheduling semiconductor wafer fabrication by using ordinal optimization-based simulation.
  7. 27

    An optimal periodic scheduler for dual-arm robots in cluster tools with residency constraints. por Rostami, S.

    Artículo

    An optimal periodic scheduler for dual-arm robots in cluster tools with residency constraints.
  8. 28

    Petri-net and GA-based approach to modeling, scheduling, and performance evaluation for wafer fabrication. por Jyh-Horn Chen

    Artículo

    Petri-net and GA-based approach to modeling, scheduling, and performance evaluation for wafer fabrication.
  9. 29

    Design of intelligent data sampling methodology based on data mining. por Jang Hee Lee

    Artículo

    Design of intelligent data sampling methodology based on data mining.
  10. 30

    Indirect adaptive control of reactive ion etching using neural networks. por Stokes, D.

    Artículo

    Indirect adaptive control of reactive ion etching using neural networks.

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