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71
Development of high-current 4H-SiC ACCUFET.
I publikationen IEEE Transactions on electron devicesArtikel -
72
Impact ionization measurements and modeling for power PHEMT.
I publikationen IEEE Transactions on electron devicesArtikel -
73
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74
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75
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76
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77
CMOS imaging for automotive applications.
I publikationen IEEE Transactions on electron devicesArtikel -
78
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79
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80