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Bridging faults and IDDQ testing
Published 1992
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CAMPUS
Diliman
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1
DATABASE
Union Catalog (Buklod)
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UNIT LIBRARY
College of Engineering Library I
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YEAR OF PUBLICATION
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CLASSIFICATION
T - Technology
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SUBJECT
Data processing
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IDDQ testing
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Metal oxide semiconductors, Complementary
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1
Testing
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1
AUTHOR
IEEE Computer Society. Test Technology Technical Committee
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RESOURCE TYPE
Book
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English
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