A mostrar 891 - 900 resultados de 1,308 para a pesquisa '"Generation."', tempo de pesquisa: 0.02seg Refinar resultados
  1. 891

    Spreading sequences for asynchronous MC-CDMA revisited accurate bit error rate analysis. Por Qinghua Shi

    Artigo

    Spreading sequences for asynchronous MC-CDMA revisited accurate bit error rate analysis.
  2. 892

    Test pattern generation and clock disabling for simultaneous test time and power reduction. Por Jih-Jeen Chen

    Artigo

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 893

    Data width requirements in SISO decoding with module normalization. Por Yufei Wu

    Artigo

    Data width requirements in SISO decoding with module normalization.
  4. 894

    Unified analysis of switched diversity systems in independent and correlated fading channels. Por Tellambura, C.

    Artigo

    Unified analysis of switched diversity systems in independent and correlated fading channels.
  5. 895

    WATSON design space boundary exploration and model generation for analog and RFIC design. Por De Smedt, B.

    Artigo

    WATSON design space boundary exploration and model generation for analog and RFIC design.
  6. 896

    SPIRIT a highly robust combinational test generation algorithm. Por Gizdarski, E.

    Artigo

    SPIRIT a highly robust combinational test generation algorithm.
  7. 897

    Structured multiuser channel estimation for block-synchronous DS Por Caire, G.

    Artigo

    Structured multiuser channel estimation for block-synchronous DS
  8. 898

    D2SA a DPSK-based distributed sample acquisition for coherently demodulated MPSK Por Byoung-Hoon Kim

    Artigo

    D2SA a DPSK-based distributed sample acquisition for coherently demodulated MPSK
  9. 899

    Interference management for CDMA systems through power control, multiuser detection, and beamforming. Por Yener, A.

    Artigo

    Interference management for CDMA systems through power control, multiuser detection, and beamforming.
  10. 900

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. Por Loukianova, N.V

    Artigo

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.

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