Résultats de la recherche - "Frontiers in Electronic Testing"

Timing performance of nanometer digital circuits under process variations par Champac, Victor, Garcia Gervacio, Jose

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Soft errors in modern electronic systems

Available for University of the Philippines Diliman via SpringerLink. Click here to access