Mitigating process variability and soft errors at circuit-level for FinFETs ανά Zimpeck, Alexandra, Meinhardt, Cristina, Artola, Laurent, Reis, Ricardo

Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy
Available for University of the Philippines System via SpringerLink. Click here to access

TFET integrated circuits from perspective towards reality ανά Gupta, Navneet, Makosiej, Adam, Amara, Amara, Vladimirescu, Andrei, Anghel, Costin

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Available for University of the Philippines System via SpringerLink. Click here to access

Circadian rhythms for future resilient electronic systems accelerated active self-healing for integrated circuits ανά Guo, Xinfei, Stan, Mircea R.

Available for University of the Philippines Diliman via SpringerLink. Click here to access
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Functionality-enhanced devices an alternative to Moore's Law

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Modeling nanowire and double-gate junctionless field-effect transistors ανά Jazaeri, Farzan, Sallese, Jean-Michel

Available for University of the Philippines Diliman via Cambridge Core. Click here to access
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Analytical modelling of breakdown effect in graphene nanoribbon field effect transistor ανά Amiri, Iraj Sadegh 1977-, Ghadiry, Mahdiar

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MOS devices for low-voltage and low-energy applications ανά Omura, Y. (Yasuhisa), Mallik, Abhijit, Matsuo, N. (Naoto)

Available for University of the Philippines Diliman via Wiley Online Library. Click here to access
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MOS devices for low-voltage and low-energy applications ανά Omura, Y. (Yasuhisa), Mallik, Abhijit, Matsuo, N. (Naoto)

High frequency MOSFET gate drivers technologies and applications ανά Zhang, ZhiLiang, Liu, Yan-Fei

Available for University of the Philippines Diliman College of Engineering via IET Digital Library. Click here to access
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Fundamentals of bias temperature instability in MOS transistors characterization methods, process and materials impact, DC and AC modeling

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