Showing 1 - 2 results of 2 for search '"Field-effect transistors Reliability."', query time: 0.02s Refine Results
  1. 1

    Mitigating process variability and soft errors at circuit-level for FinFETs by Zimpeck, Alexandra, Meinhardt, Cristina, Artola, Laurent, Reis, Ricardo

    Published 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Mitigating process variability and soft errors at circuit-level for FinFETs
  2. 2

    Strain-engineered MOSFETs by Maiti, C. K.

    Published 2013
    Available for University of the Philippines Diliman College of Engineering via CRCnetBASE. Click here to access
    Also available remotely for University of the Philippines Diliman College of Engineering via CRCnetBASE. Click here to access thru EZproxy
    Electronic Resource

    Strain-engineered MOSFETs

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