Toon 281 - 287 resultaten van 287 Voor zoekopdracht '"Faults."', zoektijd: 0,02s Verfijn jouw resultaten
  1. 281

    Evaluating capture-recapture models with two inspectors. door El Emam, K.

    Artikel

    Evaluating capture-recapture models with two inspectors.
  2. 282

    Implicit deductive fault simulation for complex delay fault models. door Deodhar, J.V

    Artikel

    Implicit deductive fault simulation for complex delay fault models.
  3. 283

    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. door Voyiatzis, I.

    Artikel

    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.
  4. 284

    Autoscan a scan design without external scan inputs or outputs. door Pomeranz, I.

    Artikel

    Autoscan a scan design without external scan inputs or outputs.
  5. 285

    Efficient reconfigurable techniques for VLSI arrays with 6-port switches. door Wu Jigang

    Artikel

    Efficient reconfigurable techniques for VLSI arrays with 6-port switches.
  6. 286

    Design and analysis of compact dictionaries for diagnosis in scan-BIST. door Chunsheng Liu

    Artikel

    Design and analysis of compact dictionaries for diagnosis in scan-BIST.
  7. 287

    Geophysical measurements bearing on the problem of the El Pilar fault in the northern venezuelan offshore. door Lidz, L.

    Artikel

    Geophysical measurements bearing on the problem of the El Pilar fault in the northern venezuelan offshore.

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