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Evaluating capture-recapture models with two inspectors.
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El Emam, K.
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IEEE Transactions on software engineering
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Implicit deductive fault simulation for complex delay fault models.
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Deodhar, J.V
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IEEE Transactions on VLSI systems
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283
Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.
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Voyiatzis, I.
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284
Autoscan a scan design without external scan inputs or outputs.
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Pomeranz, I.
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285
Efficient reconfigurable techniques for VLSI arrays with 6-port switches.
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Wu Jigang
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286
Design and analysis of compact dictionaries for diagnosis in scan-BIST.
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Chunsheng Liu
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Geophysical measurements bearing on the problem of the El Pilar fault in the northern venezuelan offshore.
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Lidz, L.
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