Search Results - "Fault."

171

An analysis of the five-wire distribution system. by Ward, D.J

Published in IEEE Transactions on power delivery

Article

An analysis of the five-wire distribution system.

172

A process-tolerant cache architecture for improved yield in nanoscale technologies. by Agarwal, A.

Published in IEEE Transactions on VLSI systems

Article

A process-tolerant cache architecture for improved yield in nanoscale technologies.

173

Weighted pseudorandom hybrid BIST. by Jas, A.

Published in IEEE Transactions on VLSI systems

Article

174

Online BIST and BIST-based diagnosis of FPGA logic blocks. by Abramovici, M.

Published in IEEE Transactions on VLSI systems

Article

Online BIST and BIST-based diagnosis of FPGA logic blocks.

175

Data mining of printed-circuit board defects. by Kusiak, A.

Published in IEEE Transactions on robotics and automation

Article

Data mining of printed-circuit board defects.

176

Fault isolation for nonisolated blocks. by Pomeranz, I.

Published in IEEE Transactions on VLSI systems

Article

177

Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. by Schmid, A.

Published in IEEE Transactions on VLSI systems

Article

Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors.

178

Error-correction and crosstalk avoidance in DSM busses. by Patel, K.N

Published in IEEE Transactions on VLSI systems

Article

Error-correction and crosstalk avoidance in DSM busses.

179

The generic consensus service. by Guerraoui, R.

Published in IEEE Transactions on software engineering

Article

180

A new maximal diagnosis algorithm for interconnect test. by Yongjoon Kim

Published in IEEE Transactions on VLSI systems

Article

An analysis of the five-wire distribution system. by Ward, D.J

A process-tolerant cache architecture for improved yield in nanoscale technologies. by Agarwal, A.

Weighted pseudorandom hybrid BIST. by Jas, A.

Online BIST and BIST-based diagnosis of FPGA logic blocks. by Abramovici, M.

Data mining of printed-circuit board defects. by Kusiak, A.

Fault isolation for nonisolated blocks. by Pomeranz, I.

Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. by Schmid, A.

Error-correction and crosstalk avoidance in DSM busses. by Patel, K.N

The generic consensus service. by Guerraoui, R.

A new maximal diagnosis algorithm for interconnect test. by Yongjoon Kim

Search Tools:

Refine Results

CAMPUS

DATABASE

UNIT LIBRARY

YEAR OF PUBLICATION

CLASSIFICATION

SUBJECT

AUTHOR

RESOURCE TYPE

LANGUAGE