Risultati della ricerca - "Fault coverage."

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  1. 1

    Exact path delay fault coverage with fundamental ZBDD operations. di Padmanaban, S.

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  2. 2

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. di Pomeranz, I.

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  3. 3

    Partial BIST insertion to eliminate data correlation. di Qiushuang Zhang

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  4. 4

    Implicit deductive fault simulation for complex delay fault models. di Deodhar, J.V

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  5. 5

    Design of hierarchical cellular automata for on-chip test pattern generator. di Sikdar, B.K

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  6. 6

    Path delay fault diagnosis and coverage-a metric and an estimation technique. di Sivaraman, M.

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  7. 7

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. di Pomeranz, I.

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  8. 8

    Weighted pseudorandom hybrid BIST. di Jas, A.

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  9. 9

    Software-based self-testing methodology for processor cores. di Li Chen

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  10. 10

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. di Ghosh, I.

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