Showing 1 - 3 results of 3 for search '"External tests."', query time: 0.02s Refine Results
  1. 1

    Testing the monster chip. by Zorian, Y.

    Published in IEEE spectrum
    Article

    Testing the monster chip.
  2. 2

    Weighted pseudorandom hybrid BIST. by Jas, A.

    Article

    Weighted pseudorandom hybrid BIST.
  3. 3

    Test data compression technique for embedded cores using virtual scan chains. by Jas, A.

    Article

    Test data compression technique for embedded cores using virtual scan chains.

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