Showing 421 - 430 results of 859 for search '"Error."', query time: 0.02s Refine Results
  1. 421

    Neural networks for improved text-independent speaker identification. by Xicai Yue

    Article

    Neural networks for improved text-independent speaker identification.
  2. 422

    A 3.3-V ISDN U-interface line driver with a new IQ-control circuit. by Jinup Lim

    Article

    A 3.3-V ISDN U-interface line driver with a new IQ-control circuit.
  3. 423

    Direct extraction of an empirical temperature-dependent InGaP by Raghavan, A.

    Article

    Direct extraction of an empirical temperature-dependent InGaP
  4. 424

    A 5-GHz direct-conversion CMOS transceiver utilizing automatic frequency control for the IEEE 802.11a wireless LAN standard. by Behzad, A.R

    Article

    A 5-GHz direct-conversion CMOS transceiver utilizing automatic frequency control for the IEEE 802.11a wireless LAN standard.
  5. 425

    A single-chip digitally calibrated 5.15-5.825-GHz 0.18-μm CMOS transceiver for 802.11a wireless LAN. by Vassiliou, I.

    Article

    A single-chip digitally calibrated 5.15-5.825-GHz 0.18-μm CMOS transceiver for 802.11a wireless LAN.
  6. 426

    A 5-GHz direct-conversion CMOS transceiver. by Pengfei Zhang

    Article

    A 5-GHz direct-conversion CMOS transceiver.
  7. 427

    A 1.8-V 6-bit 1.3-GHz flash ADC in 0.25-μm CMOS. by Uyttenhove, K.

    Article

    A 1.8-V 6-bit 1.3-GHz flash ADC in 0.25-μm CMOS.
  8. 428

    A 2-GHz carrier leakage calibrated direct-conversion WCDMA transmitter in 0.13-μm CMOS. by Brenna, G.

    Article

    A 2-GHz carrier leakage calibrated direct-conversion WCDMA transmitter in 0.13-μm CMOS.
  9. 429

    Bandwidth enhancement for transimpedance amplifiers. by Analui, B.

    Article

    Bandwidth enhancement for transimpedance amplifiers.
  10. 430

    A test circuit for measurement of clocked storage element characteristics. by Nedovic, N.

    Article

    A test circuit for measurement of clocked storage element characteristics.

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