Showing 1 - 5 results of 5 for search '"Embedded core test."', זמן שאילתה: 0.02s Refine Results
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. מאת Chandra, A.

    Article

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Nine-coded compression technique for testing embedded cores in SoCs. מאת Tehranipoor, M.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Nine-coded compression technique for testing embedded cores in SoCs.
  3. 3

    Test data compression technique for embedded cores using virtual scan chains. מאת Jas, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Test data compression technique for embedded cores using virtual scan chains.
  4. 4

    Modular and rapid testing of SOCs with unwrapped logic blocks. מאת Qiang Xu

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Modular and rapid testing of SOCs with unwrapped logic blocks.
  5. 5

    System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints. מאת Iyengar, V.

    Article

    System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints.

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