Evaluation of advanced semiconductor materials by electron microscopy

Diffraction and imaging techniques in material science

Available for University of the Philippines System via ScienceDirect. Click here to access Vol. 1
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access Vol. 1 thru EZproxy
Available for University of the Philippines System via ScienceDirect. Click here to access Vol. 2
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access Vol. 2 thru EZproxy

Proceedings of the international conference on magnetism and crystallography.