Отображение 13,701 - 13,710 результаты of 13,981 для поиска '"Designs."', время запроса: 0.05сек. Отмена результатов
  1. 13701

    Renormalization group meshes and the discretization of TCAD equations. по Schoenmaker, W.

    Статья

    Renormalization group meshes and the discretization of TCAD equations.
  2. 13702

    3-D Thermal-ADI a linear-time chip level transient thermal simulator. по Ting-Yuan Wang

    Статья

    3-D Thermal-ADI a linear-time chip level transient thermal simulator.
  3. 13703

    Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. по Yungseon Eo

    Статья

    Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system.
  4. 13704

    Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. по Gao, X.F

    Статья

    Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
  5. 13705

    Test vector generation for charge sharing failures in dynamic logic. по Heragu, K.

    Статья

    Test vector generation for charge sharing failures in dynamic logic.
  6. 13706

    Symbolic modeling of periodically time-varying systems using harmonic transfer matrices. по Vanassche, P.

    Статья

    Symbolic modeling of periodically time-varying systems using harmonic transfer matrices.
  7. 13707

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. по Dong Xiang

    Статья

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests.
  8. 13708

    Software-based self-testing methodology for processor cores. по Li Chen

    Статья

    Software-based self-testing methodology for processor cores.
  9. 13709

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. по Ghosh, I.

    Статья

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.
  10. 13710

    Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects. по Krstic, A.

    Статья

    Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects.

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