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Search Results - "Design for testability technique."
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Autoscan a scan design without external scan inputs or outputs.
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Pomeranz, I.
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IEEE Transactions on VLSI systems
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Testing ASICs with multiple identical cores.
by
Yuejian Wu
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IEEE Transactions on computer-aided design of integrated circuits and systems
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CAMPUS
Diliman
2 results
2
DATABASE
Union Catalog (Buklod)
2 results
2
UNIT LIBRARY
College of Engineering Library II
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2
RESOURCE TYPE
Article
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2
AUTHOR
Pomeranz, I.
1 results
1
Yuejian Wu
1 results
1
LANGUAGE
English
2 results
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