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Exact path delay fault coverage with fundamental ZBDD operations.
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Padmanaban, S.
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IEEE Transactions on computer-aided design of integrated circuits and systems
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Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.
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Voyiatzis, I.
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IEEE Transactions on VLSI systems
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Union Catalog (Buklod)
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Padmanaban, S.
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Voyiatzis, I.
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English
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