Zobrazuji výsledky 1 - 10 z 37 pro vyhledávání '"Circuits testing."', doba hledání: 0,02 s. Upřesnit hledání
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques Autor Huhn, Sebastian, Drechsler, Rolf

    Vydáno 2021
    Získat plný text
    Získat plný text
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Design and testing of reversible logic

    Vydáno 2020
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Design and testing of reversible logic
  3. 3

    The boundary-scan handbook Autor Parker, Kenneth P.

    Vydáno 2016
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    The boundary-scan handbook
  4. 4

    Counterfeit integrated circuits detection and avoidance Autor Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    Vydáno 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  5. 5

    Digital system test and testable design using HDL models and architectures Autor Navabi, Zainalabedin

    Vydáno 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  6. 6

    Accelerating test, validation and debug of high speed serial interfaces Autor Fan, Yongquan 1970-

    Vydáno 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  7. 7

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    Vydáno 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  8. 8

    RF measurements for cellular phones and wireless data systems Autor Scott, Allan W.

    Vydáno 2008
    Kniha

    RF measurements for cellular phones and wireless data systems
  9. 9

    Digital integrated circuits design-for-test using Simulink and Stateflow Autor Perelroyzen, Evgeni

    Vydáno 2007
    Kniha

    Digital integrated circuits design-for-test using Simulink and Stateflow
  10. 10

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Autor Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    Vydáno 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Vyhledávací nástroje: