Showing 1 - 10 results of 37 for search '"Circuits testing."', זמן שאילתה: 0.02s Refine Results
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques מאת Huhn, Sebastian, Drechsler, Rolf

    יצא לאור 2021
    קבל טקסט מלא
    קבל טקסט מלא
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Design and testing of reversible logic

    יצא לאור 2020
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Design and testing of reversible logic
  3. 3

    The boundary-scan handbook מאת Parker, Kenneth P.

    יצא לאור 2016
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    The boundary-scan handbook
  4. 4

    Counterfeit integrated circuits detection and avoidance מאת Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    יצא לאור 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  5. 5

    Digital system test and testable design using HDL models and architectures מאת Navabi, Zainalabedin

    יצא לאור 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  6. 6

    Accelerating test, validation and debug of high speed serial interfaces מאת Fan, Yongquan 1970-

    יצא לאור 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  7. 7

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    יצא לאור 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  8. 8

    RF measurements for cellular phones and wireless data systems מאת Scott, Allan W.

    יצא לאור 2008
    ספר

    RF measurements for cellular phones and wireless data systems
  9. 9

    Digital integrated circuits design-for-test using Simulink and Stateflow מאת Perelroyzen, Evgeni

    יצא לאור 2007
    ספר

    Digital integrated circuits design-for-test using Simulink and Stateflow
  10. 10

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits מאת Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    יצא לאור 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

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