Showing 31 - 37 results of 37 for search '"Circuits testing."', query time: 0.02s Refine Results
  1. 31

    Built-in self-test implementation on ARM7TDM-S microprocessor by Esguerra, Ralph Joseph A.

    Thesis

    Built-in self-test implementation on ARM7TDM-S microprocessor
  2. 32

    Nine-coded compression technique for testing embedded cores in SoCs. by Tehranipoor, M.

    Article

    Nine-coded compression technique for testing embedded cores in SoCs.
  3. 33

    POMR a power-aware interconnect optimization methodology. by Youssef, A.

    Article

    POMR a power-aware interconnect optimization methodology.
  4. 34

    Design of a 3-D fully depleted SOI computational RAM. by Koob, J.C

    Article

    Design of a 3-D fully depleted SOI computational RAM.
  5. 35

    Design of wireless on-wafer submicron characterization system. by Moore, B.

    Article

    Design of wireless on-wafer submicron characterization system.
  6. 36

    Design of hierarchical cellular automata for on-chip test pattern generator. by Sikdar, B.K

    Article

    Design of hierarchical cellular automata for on-chip test pattern generator.
  7. 37

    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. by Voyiatzis, I.

    Article

    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.

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