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Digital circuit testing a guide to DFT and other techniques
Published 1991Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy
Electronic Resource -
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Logic testing and design for testability
Published 1985Get full text
Get full text
Electronic Resource -
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Synchronization overhead in SOC compressed test.
Published in IEEE Transactions on VLSI systemsArticle -
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