Resultados da busca - "Circuits testing."

Automatic testing and evaluation of digital integrated circuits por Healy, James Thomas 1940-

The boundary-scan handbook por Parker, Kenneth P.

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Test economics and design for testability for electronic circuits and systems

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Built-in self-test implementation on ARM7TDM-S microprocessor por Esguerra, Ralph Joseph A.

Testability of electronic circuits por Weyerer, Manfred

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Simulation and implementation of UWB filter structures por Bonifacio, Marvin T.

The Test access port and boundary scan architecture

Counterfeit integrated circuits detection and avoidance por Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy