প্রদর্শন 151 - 160 ফলাফল এর 244 অনুসন্ধানের জন্য '"Circuits and systems."', জিজ্ঞাসা করার সময়: 0.03সেকেন্ড ফলাফল পরিমার্জন করুন
  1. 151

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches. অনুযায়ী Heitzinger, C.

    প্রবন্ধ

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches.
  2. 152

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. অনুযায়ী Ruifeng Guo

    প্রবন্ধ

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  3. 153

    Exact path delay fault coverage with fundamental ZBDD operations. অনুযায়ী Padmanaban, S.

    প্রবন্ধ

    Exact path delay fault coverage with fundamental ZBDD operations.
  4. 154

    Layout driven synthesis of multiple scan chains. অনুযায়ী Rahimi, K.

    প্রবন্ধ

    Layout driven synthesis of multiple scan chains.
  5. 155

    Testing ASICs with multiple identical cores. অনুযায়ী Yuejian Wu

    প্রবন্ধ

    Testing ASICs with multiple identical cores.
  6. 156

    Early probabilistic noise estimation for capacitively coupled interconnects. অনুযায়ী Becer, M.R

    প্রবন্ধ

    Early probabilistic noise estimation for capacitively coupled interconnects.
  7. 157

    Methods for minimizing dynamic power consumption in synchronous designs with multiple supply voltages. অনুযায়ী Chabini, N.

    প্রবন্ধ

    Methods for minimizing dynamic power consumption in synchronous designs with multiple supply voltages.
  8. 158

    A unified approach to reduce SOC test data volume, scan power and testing time. অনুযায়ী Chandra, A.

    প্রবন্ধ

    A unified approach to reduce SOC test data volume, scan power and testing time.
  9. 159

    Test pattern generation and clock disabling for simultaneous test time and power reduction. অনুযায়ী Jih-Jeen Chen

    প্রবন্ধ

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  10. 160

    Power supply transient signal analysis for defect-oriented test. অনুযায়ী Plusquellic, J.

    প্রবন্ধ

    Power supply transient signal analysis for defect-oriented test.

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