Showing 451 - 460 results of 483 for search '"Circuit design."', זמן שאילתה: 0.02s Refine Results
  1. 451

    Understanding MOSFET mismatch for analog design. מאת Drennan, P.G

    Article

    Understanding MOSFET mismatch for analog design.
  2. 452

    Where the jobs are. מאת Kariya, S.

    הוצא לאור ב IEEE spectrum
    Article

    Where the jobs are.
  3. 453

    Made-to-order power. מאת Shenai, K.

    הוצא לאור ב IEEE spectrum
    Article

    Made-to-order power.
  4. 454

    Analyze jitter to improve high-speed design. מאת Lauterbach, M.

    הוצא לאור ב IEEE spectrum
    Article

    Analyze jitter to improve high-speed design.
  5. 455

    Improving the manufacturability of electronic designs. מאת Stoneking, D.

    הוצא לאור ב IEEE spectrum
    Article

    Improving the manufacturability of electronic designs.
  6. 456

    Calibrating simulation tools for nanometer designs. מאת Shahram, M.

    הוצא לאור ב IEEE spectrum
    Article

    Calibrating simulation tools for nanometer designs.
  7. 457

    SubIslands the probabilistic match assignment algorithm for subcircuit recognition. מאת Rubanov, N.

    Article

    SubIslands the probabilistic match assignment algorithm for subcircuit recognition.
  8. 458

    Non-RAM-based architectural designs of wavelet-based digital systems based on novel nonlinear I מאת Dongming Peng

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Non-RAM-based architectural designs of wavelet-based digital systems based on novel nonlinear I
  9. 459

    Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design. מאת Yu Cao

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design.
  10. 460

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. מאת Schmid, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors.

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