Showing 1 - 8 results of 8 for search '"Built-in self-test."', query time: 0.02s Refine Results
  1. 1

    An architecture for large scale Internet measurement. by Paxson, V.

    Article

    An architecture for large scale Internet measurement.
  2. 2

    Testing big chips becomes an internal affair. by Runyon, S.

    Published in IEEE spectrum
    Article

    Testing big chips becomes an internal affair.
  3. 3

    Partial BIST insertion to eliminate data correlation. by Qiushuang Zhang

    Article

    Partial BIST insertion to eliminate data correlation.
  4. 4

    Weighted pseudorandom hybrid BIST. by Jas, A.

    Article

    Weighted pseudorandom hybrid BIST.
  5. 5

    Online BIST and BIST-based diagnosis of FPGA logic blocks. by Abramovici, M.

    Article

    Online BIST and BIST-based diagnosis of FPGA logic blocks.
  6. 6

    A built-in self-repair design for RAMs with 2-D redundancy. by Jin-Fu Li

    Article

    A built-in self-repair design for RAMs with 2-D redundancy.
  7. 7

    Formulating SoC test scheduling as a network transportation problem. by Koranne, S.

    Article

    Formulating SoC test scheduling as a network transportation problem.
  8. 8

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. by Dong Xiang

    Article

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests.

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