Search Results - "Built-in self test."

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  1. 1

    Partial BIST insertion to eliminate data correlation. by Qiushuang Zhang

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  2. 2

    A built-in self-repair design for RAMs with 2-D redundancy. by Jin-Fu Li

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  3. 3

    Testing big chips becomes an internal affair. by Runyon, S.

    Published in IEEE spectrum
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  4. 4

    An architecture for large scale Internet measurement. by Paxson, V.

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  5. 5

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. by Dong Xiang

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  6. 6

    Online BIST and BIST-based diagnosis of FPGA logic blocks. by Abramovici, M.

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  7. 7

    Weighted pseudorandom hybrid BIST. by Jas, A.

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  8. 8

    Formulating SoC test scheduling as a network transportation problem. by Koranne, S.

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