Canlyniadau Chwilio - "Built-in self test."

  • Dangos 1 - 8 canlyniadau o 8
Mireinio'r Canlyniadau
  1. 1

    Partial BIST insertion to eliminate data correlation. gan Qiushuang Zhang

    Erthygl


    Delwedd Flaen
  2. 2

    A built-in self-repair design for RAMs with 2-D redundancy. gan Jin-Fu Li

    Erthygl


    Delwedd Flaen
  3. 3

    Testing big chips becomes an internal affair. gan Runyon, S.

    Cyhoeddwyd yn IEEE spectrum
    Erthygl


    Delwedd Flaen
  4. 4

    An architecture for large scale Internet measurement. gan Paxson, V.

    Erthygl


    Delwedd Flaen
  5. 5

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. gan Dong Xiang

    Erthygl


    Delwedd Flaen
  6. 6

    Online BIST and BIST-based diagnosis of FPGA logic blocks. gan Abramovici, M.

    Erthygl


    Delwedd Flaen
  7. 7

    Weighted pseudorandom hybrid BIST. gan Jas, A.

    Erthygl


    Delwedd Flaen
  8. 8

    Formulating SoC test scheduling as a network transportation problem. gan Koranne, S.

    Erthygl


    Delwedd Flaen

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