Bilaketaren emaitzak - "Built-in self test."

  • Erakusten 1 - 8 emaitzak -- 8
Findu emaitzak
  1. 1

    Partial BIST insertion to eliminate data correlation. nork Qiushuang Zhang

    Artikulua


    Azala
  2. 2

    A built-in self-repair design for RAMs with 2-D redundancy. nork Jin-Fu Li

    Argitaratua izan da IEEE Transactions on VLSI systems
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    Azala
  3. 3

    Testing big chips becomes an internal affair. nork Runyon, S.

    Argitaratua izan da IEEE spectrum
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    Azala
  4. 4

    An architecture for large scale Internet measurement. nork Paxson, V.

    Argitaratua izan da IEEE Communications magazine
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    Azala
  5. 5

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. nork Dong Xiang

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    Azala
  6. 6

    Online BIST and BIST-based diagnosis of FPGA logic blocks. nork Abramovici, M.

    Argitaratua izan da IEEE Transactions on VLSI systems
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    Azala
  7. 7

    Weighted pseudorandom hybrid BIST. nork Jas, A.

    Argitaratua izan da IEEE Transactions on VLSI systems
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    Azala
  8. 8

    Formulating SoC test scheduling as a network transportation problem. nork Koranne, S.

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    Azala

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