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Physical random number generator based on MOS structure after soft breakdown.
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Yasuda, S.
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IEEE Journal of solid state circuits
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The toughest transistor yet [GaN transistors].
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Eastman, L.F
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Effect of acetaminophen on the corrosion resistance of nickel-titanium, stainless steel and titanium-molybdenum wires in artificial saliva pH levels of 7.0 and 3.5
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Shams, Ali
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Keeping the lights on [power system reliability].
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Mountford, J.D
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Analysis of surface-state and impact-ionization effects on breakdown characteristics and gate-lag phenomena in narrowly recessed gate GaAs FETs.
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Mitani, Y.
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IEEE Transactions on electron devices
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Impact ionization measurements and modeling for power PHEMT.
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Baksht, T.
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