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Exact path delay fault coverage with fundamental ZBDD operations.
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Padmanaban, S.
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IEEE Transactions on computer-aided design of integrated circuits and systems
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Function-based compact test pattern generation for path delay faults.
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Robust Boolean reasoning for equivalence checking and functional property verification.
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Kuehlmann, A.
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A 10-Gbps full-AES crypto design with a twisted BDD S-Box architecture.
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BDD decomposition for delay oriented pass transistor logic synthesis.
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Polarity Correspondence A General Principle for Performance of Speeded Binary Classification Tasks. [article].
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Proctor, Robert W.
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DATABASE
Union Catalog (Buklod)
6 results
6
SUBJECT
Binary decisions
1 results
1
Implicit Association Test
1 results
1
MARC effect
1 results
1
SNARC effect
1 results
1
Stimulus-response compatibility
1 results
1
AUTHOR
Kuehlmann, A.
1 results
1
Michael, M.K
1 results
1
Morioka, S.
1 results
1
Padmanaban, S.
1 results
1
Proctor, Robert W.
1 results
1
Shelar, R.S
1 results
1
RESOURCE TYPE
Article
5 results
5
Analytics
1 results
1
LANGUAGE
English
5 results
5
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