Erakusten 161 - 170 emaitzak -- 171 bilaketa honetara '"Benchmarking."', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 161

    On metrics for comparing interconnect estimation methods for FPGAs. nork Kannan, P.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    On metrics for comparing interconnect estimation methods for FPGAs.
  2. 162

    A software nork Skliarova, I.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    A software
  3. 163

    Leakage current reduction in CMOS VLSI circuits by input vector control. nork Abdollahi, A.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Leakage current reduction in CMOS VLSI circuits by input vector control.
  4. 164

    Gate oxide leakage current analysis and reduction for VLSI circuits. nork Dongwoo Lee

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Gate oxide leakage current analysis and reduction for VLSI circuits.
  5. 165

    LECTOR a technique for leakage reduction in CMOS circuits. nork Hanchate, N.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    LECTOR a technique for leakage reduction in CMOS circuits.
  6. 166

    Linearization of the timing analysis and optimization of level-sensitive digital synchronous circuits. nork Taskin, B.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Linearization of the timing analysis and optimization of level-sensitive digital synchronous circuits.
  7. 167

    A game theoretic approach for power optimization during behavioral synthesis. nork Murugavel, A.K

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    A game theoretic approach for power optimization during behavioral synthesis.
  8. 168

    BDD decomposition for delay oriented pass transistor logic synthesis. nork Shelar, R.S

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    BDD decomposition for delay oriented pass transistor logic synthesis.
  9. 169

    Design and analysis of compact dictionaries for diagnosis in scan-BIST. nork Chunsheng Liu

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Design and analysis of compact dictionaries for diagnosis in scan-BIST.
  10. 170

    Satisfaction, complaint, and the stock value gap. nork Xueming Luo

    Argitaratua izan da Journal of marketing
    Artikulua

    Satisfaction, complaint, and the stock value gap.

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