Showing 161 - 170 results of 171 for search '"Benchmarking"', सवाल का समय: 0.02सेकंड परिणाम को परिष्कृत करें
  1. 161

    On metrics for comparing interconnect estimation methods for FPGAs. द्वारा Kannan, P.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    On metrics for comparing interconnect estimation methods for FPGAs.
  2. 162

    A software द्वारा Skliarova, I.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    A software
  3. 163

    Leakage current reduction in CMOS VLSI circuits by input vector control. द्वारा Abdollahi, A.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Leakage current reduction in CMOS VLSI circuits by input vector control.
  4. 164

    Gate oxide leakage current analysis and reduction for VLSI circuits. द्वारा Dongwoo Lee

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Gate oxide leakage current analysis and reduction for VLSI circuits.
  5. 165

    LECTOR a technique for leakage reduction in CMOS circuits. द्वारा Hanchate, N.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    LECTOR a technique for leakage reduction in CMOS circuits.
  6. 166

    Linearization of the timing analysis and optimization of level-sensitive digital synchronous circuits. द्वारा Taskin, B.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Linearization of the timing analysis and optimization of level-sensitive digital synchronous circuits.
  7. 167

    A game theoretic approach for power optimization during behavioral synthesis. द्वारा Murugavel, A.K

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    A game theoretic approach for power optimization during behavioral synthesis.
  8. 168

    BDD decomposition for delay oriented pass transistor logic synthesis. द्वारा Shelar, R.S

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    BDD decomposition for delay oriented pass transistor logic synthesis.
  9. 169

    Design and analysis of compact dictionaries for diagnosis in scan-BIST. द्वारा Chunsheng Liu

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Design and analysis of compact dictionaries for diagnosis in scan-BIST.
  10. 170

    Satisfaction, complaint, and the stock value gap. द्वारा Xueming Luo

    में प्रकाशित Journal of marketing
    लेख

    Satisfaction, complaint, and the stock value gap.

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