Toon 151 - 160 resultaten van 171 Voor zoekopdracht '"Benchmarking"', zoektijd: 0,02s Verfijn jouw resultaten
  1. 151

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. door Pomeranz, I.

    Artikel

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.
  2. 152

    Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects. door Krstic, A.

    Artikel

    Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects.
  3. 153

    Path delay fault diagnosis and coverage-a metric and an estimation technique. door Sivaraman, M.

    Artikel

    Path delay fault diagnosis and coverage-a metric and an estimation technique.
  4. 154

    Designing a successful trading agent A fuzzy set approach. door Minghua He

    Artikel

    Designing a successful trading agent A fuzzy set approach.
  5. 155

    Fuzzy control of a benchmark problem a computing with words approach. door Margaliot, M.

    Artikel

    Fuzzy control of a benchmark problem a computing with words approach.
  6. 156

    Diagnosing Old MI by Searching for a Linear Boundary in the Space of Principal Components. door Donnelly, M.P

    Artikel

    Diagnosing Old MI by Searching for a Linear Boundary in the Space of Principal Components.
  7. 157

    Combined circuit and architectural level variable supply-voltage scaling for low power. door Hai Li

    Artikel

    Combined circuit and architectural level variable supply-voltage scaling for low power.
  8. 158

    Engineering dynamic real-time distributed systems architecture, system description language, and middleware. door Ravindran, B.

    Artikel

    Engineering dynamic real-time distributed systems architecture, system description language, and middleware.
  9. 159

    Multiple-symbol parallel decoding for variable length codes. door Nikara, J.

    Artikel

    Multiple-symbol parallel decoding for variable length codes.
  10. 160

    Calibration of Rent's rule models for three-dimensional integrated circuits. door Das, S.

    Artikel

    Calibration of Rent's rule models for three-dimensional integrated circuits.

Zoekinstrumenten: