Prikaz rezultata 7.281 – 7.290 od 7.797 za pretragu '"Behavior"', vrijeme upita: 0,03s Detaljiziraj rezultate
  1. 7281

    Impact of capacitor dielectric relaxation on a 14-bit 70-MS od Zanchi, A.

    Članak

    Impact of capacitor dielectric relaxation on a 14-bit 70-MS
  2. 7282

    Active-feedback frequency-compensation technique for low-power multistage amplifiers. od Hoi Lee

    Članak

    Active-feedback frequency-compensation technique for low-power multistage amplifiers.
  3. 7283

    Reconsidering microscopic mobility modeling for self-organizing networks. od Legendre, F.

    Članak

    Reconsidering microscopic mobility modeling for self-organizing networks.
  4. 7284

    Adaptive algorithms for feedback-based flow control in high-speed, wide-area ATM networks. od Bonomi, F.

    Članak

    Adaptive algorithms for feedback-based flow control in high-speed, wide-area ATM networks.
  5. 7285

    Diffusion approximation modeling for Markov modulated bursty traffic and its applications to bandwidth allocation in ATM networks. od Qiang Ren

    Članak

    Diffusion approximation modeling for Markov modulated bursty traffic and its applications to bandwidth allocation in ATM networks.
  6. 7286

    Analysis of discarding policies in high-speed networks. od Lapid, Y.

    Članak

    Analysis of discarding policies in high-speed networks.
  7. 7287

    KhepOnTheWeb open access to a mobile robot on the Internet. od Saucy, P.

    Članak

    KhepOnTheWeb open access to a mobile robot on the Internet.
  8. 7288

    Mind the gap [age gap problems between employees]. od Schiff, D.

    Izdano u IEEE spectrum
    Članak

    Mind the gap [age gap problems between employees].
  9. 7289

    Timed Petri nets in modeling and analysis of cluster tools. od Zuberek, W.M

    Članak

    Timed Petri nets in modeling and analysis of cluster tools.
  10. 7290

    Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. od MuDer Jeng

    Članak

    Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons.

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