Showing 1 - 5 results of 5 for search '"Automatic test pattern generators."', सवाल का समय: 0.02सेकंड परिणाम को परिष्कृत करें
  1. 1

    Testing big chips becomes an internal affair. द्वारा Runyon, S.

    में प्रकाशित IEEE spectrum
    लेख

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. द्वारा Chien-Mo Li, J.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. द्वारा Michael, M.K

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. द्वारा Kagaris, D.

    लेख

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. द्वारा Ghosh, I.

    लेख

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

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