Treffer 1 - 5 von 5 für Suche '"Automatic test pattern generators."', Suchdauer: 0,02s Treffer weiter einschränken
  1. 1

    Testing big chips becomes an internal affair. von Runyon, S.

    Veröffentlicht in IEEE spectrum
    Artikel

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. von Chien-Mo Li, J.

    Artikel

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. von Michael, M.K

    Artikel

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. von Kagaris, D.

    Artikel

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. von Ghosh, I.

    Artikel

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

Suchwerkzeuge: