Showing 1 - 5 results of 5 for search '"Automatic test pattern generators."', query time: 0.02s Refine Results
  1. 1

    Testing big chips becomes an internal affair. by Runyon, S.

    Published in IEEE spectrum
    Article

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. by Chien-Mo Li, J.

    Article

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. by Michael, M.K

    Article

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. by Kagaris, D.

    Article

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. by Ghosh, I.

    Article

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

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