Gösterilen 1 - 5 sonuçlar arası kayıtlar. 5 sonuç. Aranan kelime '"Automatic test pattern generation."', Sorgu süresi: 0.02s Sonuçları Daraltın
  1. 1

    Testing big chips becomes an internal affair. Yazar: Runyon, S.

    Yayımlandı IEEE spectrum
    Makale

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. Yazar: Chien-Mo Li, J.

    Makale

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. Yazar: Michael, M.K

    Makale

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. Yazar: Kagaris, D.

    Makale

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. Yazar: Ghosh, I.

    Makale

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

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