Erakusten 1 - 5 emaitzak -- 5 bilaketa honetara '"Automatic test pattern generation."', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 1

    Testing big chips becomes an internal affair. nork Runyon, S.

    Argitaratua izan da IEEE spectrum
    Artikulua

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. nork Chien-Mo Li, J.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. nork Michael, M.K

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. nork Kagaris, D.

    Artikulua

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. nork Ghosh, I.

    Artikulua

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

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