Showing 1 - 5 results of 5 for search '"Automatic test pattern generation."', tempo de consulta: 0.02s Limitar resultados
  1. 1

    Testing big chips becomes an internal affair. por Runyon, S.

    Publicado en IEEE spectrum
    Artigo

    Testing big chips becomes an internal affair.
  2. 2

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains. por Chien-Mo Li, J.

    Artigo

    Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
  3. 3

    Function-based compact test pattern generation for path delay faults. por Michael, M.K

    Artigo

    Function-based compact test pattern generation for path delay faults.
  4. 4

    On the nonenumerative path delay fault simulation problem. por Kagaris, D.

    Artigo

    On the nonenumerative path delay fault simulation problem.
  5. 5

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. por Ghosh, I.

    Artigo

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams.

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